From a896993ed1c3fd57fa0ecf1836805e905dec041d Mon Sep 17 00:00:00 2001 From: Jaakko Korhonen Date: Mon, 15 Apr 2019 13:59:17 +0300 Subject: [PATCH] Prevent stack overflow from general_block_device test. This test was failing randomly on NUCLEO_F412ZG using SDCard (https://jira.arm.com/browse/IOTSTOR-828). --- .../storage/TESTS/blockdevice/general_block_device/main.cpp | 2 +- 1 file changed, 1 insertion(+), 1 deletion(-) diff --git a/features/storage/TESTS/blockdevice/general_block_device/main.cpp b/features/storage/TESTS/blockdevice/general_block_device/main.cpp index 32911f741c5..f827f9dd581 100644 --- a/features/storage/TESTS/blockdevice/general_block_device/main.cpp +++ b/features/storage/TESTS/blockdevice/general_block_device/main.cpp @@ -64,7 +64,7 @@ using namespace utest::v1; #define TEST_BLOCK_COUNT 10 #define TEST_ERROR_MASK 16 #define TEST_NUM_OF_THREADS 5 -#define TEST_THREAD_STACK_SIZE 1024 +#define TEST_THREAD_STACK_SIZE 2048 uint8_t num_of_sectors = TEST_NUM_OF_THREADS * TEST_BLOCK_COUNT; uint32_t sectors_addr[TEST_NUM_OF_THREADS * TEST_BLOCK_COUNT] = {0};